IEC 60749-20:2002 pdf download
IEC 60749-20:2002 pdf download.Semiconductor devices – Mechanical and climatic test methods – Part 20: Resistance of plastic-encapsulated SMDs to the combined effect of moisture and soldering heat 1 Scope and object This part of IEC 60749 applies to semiconductor devices (discrete devices and integrated circuits). This test method provides a means of assessing the resistance to soldering heat of plastic-...
IEC 60749-7:2002 pdf download
IEC 60749-7:2002 pdf download.SEMICONDUCTOR DEVICES – MECHANICAL AND CLIMATIC TEST METHODS – Part 7: Internal moisture content measurement and the analysis of other residual gases 1 Scope The purpose of this part of IEC 60749 is to test and measure the water vapour and other gas content of the atmosphere inside a metal or ceramic hermetically sealed device. It is...
IEC 60749-10:2002 pdf download
IEC 60749-10:2002 pdf download.SEMICONDUCTOR DEVICES – MECHANICAL AND CLIMATIC TEST METHODS – Part 10: Mechanical shock 1 Scope This part of IEC 60749 describes a shock test intended to determine the suitability of component parts for use in electronic equipment which may be subjected to moderately severe shocks as a result of suddenly applied forces or abrupt changes in motion...
IEC 60749-18:2002 pdf download
IEC 60749-18:2002 pdf download.Semiconductor devices – Mechanical and climatic test methods – Part 18: Ionizing radiation (total dose) 1 Scope This part of IEC 60749 provides a test procedure for defining requirements for testing packaged semiconductor integrated circuits and discrete semiconductor devices for ionizing radiation (total dose) effects from a cobalt-60 ( 60 Co) gamma ray source. This standard provides...
IEC 60749-6:2002 pdf download
IEC 60749-6:2002 pdf download.SEMICONDUCTOR DEVICES – MECHANICAL AND CLIMATIC TEST METHODS – Part 6: Storage at high temperature 1 Scope The purpose of this part of IEC 60749 is to test and determine the effect on all semiconductor electronic devices of storage at elevated temperature without electrical stress applied. This test is considered non-destructive but should preferably be used for...
IEC 60749-3:2002 pdf download
IEC 60749-3:2002 pdf download.Semiconductor devices – Mechanical and climatic test methods – Part 3: External visual examination 1 Scope The purpose of this part of IEC 60749 is to verify that the materials, design, construction, markings, and workmanship of a semiconductor device are in accordance with the applicable procurement document. External visual inspection is a non-destructive test and applicable for...
IEC 60748-1:2002 pdf download
IEC 60748-1:2002 pdf download.Semiconductor devices – Integrated circuits 1 Scope and object This part of IEC 60748 gives general information on integrated circuits. The object of this part of IEC 60748 is to provide information on the general principles or requirements applicable to the IEC 60748 series, which includes the standards for the various categories or sub-categories of integrated circuits....
IEC 60702-1:2002 pdf download
IEC 60702-1:2002 pdf download.Mineral insulated cables and their terminations with a rated voltage not exceeding 750 V 1 Scope This standard applies to mineral insulated general wiring cables with copper or copper alloy sheath and copper conductors and with rated voltages of 500 V and 750 V. Provision is made for a corrosion-resistant extruded outer covering over the copper sheath,...
IEC 60691:2002 pdf download
IEC 60691:2002 pdf download.Thermal-links – Requirements and application guide Replace, on page 43, the existing item g) by the following new item g): g) Compliance is checked by the following test. For thermal-links rated 249 °C or lower, the sample shall be placed in a test oven, stabilized at a temperature of T f – 12 K or as declared...
IEC 60652:2002 pdf download
IEC 60652:2002 pdf download.Loading tests on overhead line structures 1 Scope This International Standard codifies the methods of testing supports for overhead lines. It is applicable to the testing of supports and structures of overhead lines for voltages above 45 kV; it can also serve as reference to the testing of lower voltage supports. There is no restriction on the...